Advantest Pin Scale 5000B boosts V93000 EXA Scale vector memory to 5 Gbps

Advantest has introduced Pin Scale 5000B, a digital test solution for its V93000 EXA Scale test platform aimed at rising test demands for advanced AI and HPC devices.

Advantest ties the need for higher test capability to increasing device complexity from advanced process nodes, heterogeneous integration, and chiplet-based architectures. The company says those designs are driving requirements for higher structural and functional test coverage, along with handling larger volumes of test data.

On the instrumentation side, Pin Scale 5000B expands vector memory capacity, targeting deeper and scalable pattern storage. Advantest also points to hardware and software intended to optimize memory usage for chiplet-based architectures, with the goal of lowering overall memory consumption and cost while supporting future memory requirements. The company also says the card is designed to let customers scale existing test programs and hardware configurations as device requirements change.

Pin Scale 5000B is designed for contemporary scan fabric architectures and supports concurrent testing of multiple IP cores using a streaming approach. Advantest says the hardware enables observing test results across multiple cores within a single test pattern execution, which is intended to improve core-level visibility into error distribution. For test engineering teams, that visibility matters because multi-core and chiplet devices can fail in ways that aren’t well localized by coarse test readouts, and tighter observability can reduce the iteration loop between pattern development and yield learning.

The company rates Pin Scale 5000B for data rates up to 5 Gbps, using the pin electronics architecture of the earlier Pin Scale 5000. Pin Scale 5000B is described as a fully compatible superset of Pin Scale 5000 and is positioned as a complement within the V93000 portfolio.

“Pin Scale 5000B builds on and complements our existing proven Pin Scale 5000 card to further expand the capabilities of the V93000 EXA Scale platform with the performance and scalability our customers need to address increasing device complexity,” said Ralf Stoffels, executive officer and division manager, V93000 Product Unit, Advantest.

Advantest says the Pin Scale 5000B digital test instrument is now ramping with key customers.

Advantest

Source: Advantest

Get Data Center Engineering News In Your Inbox:

Popular Posts:

picotest-thumbnail
A closer look at power integrity at AI scale
Leak Testing Liquid-Cooled Server Racks Poppe+Potthoff
Testing the weak spots in liquid-cooled server racks: design the connection like it’s the product
DCE
Advanced cooling methods for data center power electronics
How CDU location can change UPS count, redundancy design, and retrofit complexity
How CDU location can change UPS count, redundancy design, and retrofit complexity
Nidec
Nidec develops 300 kW in-rack CDU for AI liquid cooling

Share Your Data Center Engineering News

Do you have a new product announcement, webinar, whitepaper, or article topic? 

Get Data Center Engineering News In Your Inbox: